American Journal of Roentgenology Online -- Index by Author (1 May 2000, 174, Number 5)

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Index by Author: 1 May 2000; 174 (5) [Table of Contents]

| A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y |

A: Abrahams, James J. [Abstract] [Full Text]; Aibe, Hitoshi [Abstract] [Full Text]; Alarcón, Javier [Full Text]; Alegre, Maria L. Sánchez [Full Text]; Arbib, François [Abstract] [Full Text]; Arenas, Juan [Abstract] [Full Text]
B: Baxter, Alexander B. [Full Text]; Berlin, Leonard [Full Text]; Berlin, Leonard [Full Text]; Bert, R. J. [Full Text]; Beville, Lee [Full Text]; Bilecen, Deniz [Full Text]; Bongartz, G. [Full Text]; Bosson, Jean-Luc [Abstract] [Full Text]; Bowie, James D. [Abstract] [Full Text]; Brenner, R. James [Abstract] [Full Text]; Brogdon, B. G. [Full Text]; Brookenthal, Keith R. [Abstract] [Full Text]; Burke, George J. [Full Text]
C: Camp, Joan [Abstract] [Full Text]; Carroll, Barbara A. [Abstract] [Full Text]; Casarella, William J. [Full Text]; Casford, Brant [Full Text]; Casper, G. David [Abstract] [Full Text]; Chan, Ling-Ling [Full Text]; Chang, Kee Hyun [Abstract] [Full Text]; Chicco, Peter [Abstract] [Full Text]; Cirillo, Vincent J. [Full Text]; Corley, James H. [Full Text]; Coulomb, Max [Abstract] [Full Text]; Craig, J. [Full Text]; Craven, C. M. [Abstract] [Full Text]; Crewson, Philip E. [Abstract] [Full Text]; Cvitanic, Oliver A. [Abstract] [Full Text]; Czerniak, Bogdan A. [Full Text]
D: Daffner, Richard H. [Full Text]; de España, Francisco [Abstract] [Full Text]; de la Iglesia, Pedro [Abstract] [Full Text]; de la Torre, Jesus [Full Text]; Deliganis, Anastasia V. [Full Text]; DeLong, David H. [Abstract] [Full Text]; DeMeo, Jonathan H. [Abstract] [Full Text]; Denk, D. [Abstract] [Full Text]; Dennis, Mark A. [Abstract] [Full Text]; Dinkel, Hans-Peter [Abstract] [Full Text]; Donnelly, Lane F. [Full Text]
E: Eberhardt, Linton W. [Full Text]; Eisenhuber, E. [Abstract] [Full Text]; Elicker, Brett M. [Full Text]; Elliott, J. Mark [Abstract] [Full Text]; Elmas, Nevra [Full Text]; Elmore, J. G. [Abstract] [Full Text]; Eubig, Casimir [Full Text]
F: Ferretti, Gilbert R. [Abstract] [Full Text]; Fessell, D. P. [Full Text]; Forauer, Andrew R. [Abstract] [Full Text]; Frank, Mark S. [Full Text]; Freys, Stefan M. [Abstract] [Full Text]; Fuchs, Karl-Hermann [Abstract] [Full Text]; Fukuoka, Haruhito [Full Text]
G: Gailloud, Philippe [Full Text]; Gassel, Heinz-Jochen [Abstract] [Full Text]; Genant, Harry K. [Abstract] [Full Text]; Gil, Santiago [Abstract] [Full Text]; Gilkeson, R. C. [Full Text]; Ginsberg, Lawrence E. [Full Text]; Girard, Stephanie [Abstract] [Full Text]; Glockner, James F. [Abstract] [Full Text]; Goodman, Chad J. [Abstract] [Full Text]; Grainger, Andrew J. [Abstract] [Full Text]; Gray, Linda [Abstract] [Full Text]; Guembe, Pedro [Full Text]
H: Habra, G. [Full Text]; Hall, Ferris M. [Full Text]; Han, Man Chung [Abstract] [Full Text]; Hansell, David M. [Abstract] [Full Text]; Harris, Alison C. [Full Text]; Hayt, Michael W. [Abstract] [Full Text]; Heimbucher, Johannes [Abstract] [Full Text]; Hertzberg, Barbara S. [Abstract] [Full Text]; Herzog, Richard [Abstract] [Full Text]; Hinson, Gary [Abstract] [Full Text]; Hochman, M. G. [Abstract] [Full Text]; Honda, Hiroshi [Abstract] [Full Text]; Hori, Masatoshi [Abstract] [Full Text]; Hoshi, Hiroaki [Abstract] [Full Text]; Howling, Sarah J. [Abstract] [Full Text]; Hunt, Karen A. [Abstract] [Full Text]
I: Im, Jung-Gi [Abstract] [Full Text]; Imazu, Michinori [Full Text]; Irie, Hiroyuki [Abstract] [Full Text]; Irurzun, Javier [Abstract] [Full Text]; Ito, Katsuhide [Full Text]
J: Jacobson, J. A. [Full Text]; Jang, Hyun-Jung [Abstract] [Full Text]
K: Kane, R. A. [Abstract] [Full Text]; Kanematsu, Masayuki [Abstract] [Full Text]; Karunaratne, Nishantha [Full Text]; Kaske, Terese I. [Abstract] [Full Text]; Kassem-Moussa, H. [Full Text]; Khaw, Nathalie [Full Text]; Killeen, Karen L. [Abstract] [Full Text]; Killi, Refik M [Full Text]; Kim, Eung Yeop [Abstract] [Full Text]; Kim, Seung Hoon [Abstract] [Full Text]; Kim, Tonsok [Abstract] [Full Text]; Kingzett-Taylor, Andrew [Abstract] [Full Text]; Kirby, Thomas J. [Full Text]; Kliewer, Mark A. [Abstract] [Full Text]; Kliewer, Mark A. [Full Text]; Kneeland, J. Bruce [Abstract] [Full Text]; Knüpffer, Joachim [Abstract] [Full Text]; Kobayashi, Hisataka [Full Text]; Koh, Young Hwan [Abstract] [Full Text]; Kohata, Minako [Full Text]; Kraus, Simon [Abstract] [Full Text]; Krejza, J. [Full Text]; Kruskal, J. B. [Abstract] [Full Text]; Kumar, Priya [Full Text]; Kuroiwa, Toshiro [Abstract] [Full Text]
L: Lange, Paul [Full Text]; LeBlang, Suzanne D. [Full Text]; Lechner, G. [Abstract] [Full Text]; Lee, Josephine [Abstract] [Full Text]; Lee, Soon Jin [Abstract] [Full Text]; Lee, Won Jae [Abstract] [Full Text]; Lewis, D. V. [Full Text]; Li, Su-Ting T. [Full Text]; Liang, Grace S. [Full Text]; Liberman, Laura [Full Text]; Lim, Hyo K. [Abstract] [Full Text]; Lindsey, Jason I. [Abstract] [Full Text]; Loevner, Laurie A. [Full Text]; Longmaid, H. Esterbrook III [Abstract] [Full Text]; Longmaid, H. Esterbrook III [Full Text]; Ludwig, Arwed [Abstract] [Full Text]; Lyburn, Iain D. [Full Text]; Lyrer, Philippe [Full Text]
M: Magee, Thomas [Abstract] [Full Text]; Magnussen, John S. [Abstract] [Full Text]; Mann, Stephen [Full Text]; Mariak, Z. [Full Text]; Markel, Thomas O. [Full Text]; Marks, David S. [Full Text]; Masuda, Kouji [Abstract] [Full Text]; Melhem, E. R. [Full Text]; Mergo, Patricia J. [Abstract] [Full Text]; Merritt, Christopher R. B. [Full Text]; Mirvis, Stuart E. [Abstract] [Full Text]; Miyasaka, Kenji [Full Text]; Moll, Roland [Abstract] [Full Text]; Moon, Woo Kyung [Abstract] [Full Text]; Moritz, Jörg D. [Abstract] [Full Text]; Morrin, M. M. [Abstract] [Full Text]; Moss, Richard B. [Abstract] [Full Text]; Müller, Nestor L. [Abstract] [Full Text]; Murakami, Takamichi [Abstract] [Full Text]; Myers, Jeffrey L. [Abstract] [Full Text]
N: Nakamura, Hironobu [Abstract] [Full Text]; Nakanishi, Tadashi [Full Text]; Nathan, M. Herbert [Full Text]; Nelson, Rendon C. [Abstract] [Full Text]; Northway, William H. Jr. [Abstract] [Full Text]; Nunez, Diego B. Jr. [Full Text]
O: O'Riordan, E. [Abstract] [Full Text]; Oestmann, Jörg-W. [Abstract] [Full Text]; Özütemiz, Ömer [Full Text]
P: Palmer, Amanda W. [Abstract] [Full Text]; Parker, Steve [Abstract] [Full Text]; Partik, B. [Abstract] [Full Text]; Perman, William H. [Abstract] [Full Text]; Petrella, J. R. [Full Text]; Pison, Christophe [Abstract] [Full Text]; Pokieser, P. [Abstract] [Full Text]; Prasad, A. [Full Text]; Prisant, L. Michael [Full Text]; Provenzale, J. M. [Full Text]
Q
R: Radliff, A. [Full Text]; Radue, Ernst W. [Full Text]; Ramsey, Matthew L. [Abstract] [Full Text]; Raptopoulos, Vassillios [Abstract] [Full Text]; Reynolds, Handel E. [Full Text]; Reynolds, Kevin F. [Abstract] [Full Text]; Ridley, Lloyd [Full Text]; Robinson, Arvin [Abstract] [Full Text]; Robinson, P. J. [Abstract] [Full Text]; Robinson, Vincent J. B. [Full Text]; Rock, Reuben [Abstract] [Full Text]; Rogers, Lee F. [Full Text]; Rosen, Eric L. [Full Text]; Rosen, Max P. [Abstract] [Full Text]; Rowley, V. A. [Full Text]; Rutter, C. M. [Abstract] [Full Text]
S: Saldinger, P. F. [Abstract] [Full Text]; Sands, Daniel Z. [Abstract] [Full Text]; Schatzki, Stefan [Full Text]; Scheffler, Klaus [Full Text]; Schima, W. [Abstract] [Full Text]; Schimandle, Jeffrey [Abstract] [Full Text]; Schindler, Gerhard [Abstract] [Full Text]; Schober, E. [Abstract] [Full Text]; Seger, D. [Abstract] [Full Text]; Seifritz, Erich [Full Text]; Shanmuganathan, K. [Abstract] [Full Text]; Shannon, William M. [Full Text]; Shimada, Mitsuo [Abstract] [Full Text]; Shinozaki, Kenji [Abstract] [Full Text]; Sickles, Edward A. [Abstract] [Full Text]; Sickles, Edward A. [Full Text]; Sistrom, Chris L. [Abstract] [Full Text]; Solano, Thomas [Full Text]; Solomon, Harvey [Abstract] [Full Text]; Stadler, A. [Abstract] [Full Text]; Stavros, A. Thomas [Abstract] [Full Text]; Steinbach, Lynne S. [Abstract] [Full Text]; Steinberg, Kenneth P. [Full Text]; Stern, Eric J. [Full Text]; Stone, Jeffrey A. [Full Text]; Sunshine, Jonathan H. [Abstract] [Full Text]; Swensen, Stephen J. [Abstract] [Full Text]
T: Takahashi, Satoru [Abstract] [Full Text]; Takamura, Manabu [Abstract] [Full Text]; Taplin, S. H. [Abstract] [Full Text]; Taylor, Caroline R. [Full Text]; Taylor, George A. [Full Text]; Taylor, George A. [Full Text]; Thony, Frédéric [Abstract] [Full Text]; Tirman, Phillip F. J. [Abstract] [Full Text]; Tirman, Phillip F. J. [Abstract] [Full Text]; Togashi, Kaori [Full Text]; Torreggiani, William C. [Full Text]; Tsuda, Kyo [Abstract] [Full Text]
U
V: Van der Wall, Hans [Abstract] [Full Text]; van Holsbeeck, M. T. [Full Text]; Varma, Chintalapati R. [Abstract] [Full Text]; Verdú, José F. [Abstract] [Full Text]; Vu, Dzung H. [Abstract] [Full Text]
W: Wagner, Michelle [Abstract] [Full Text]; Ward, Suzanne [Abstract] [Full Text]; Webb, Emily M. [Full Text]; Webb, W. Richard [Full Text]; Weinmann, Hanns-Joachim [Abstract] [Full Text]; Wetzel, Stephan G. [Full Text]; Whigham, Cliff J. [Abstract] [Full Text]; White, D. [Abstract] [Full Text]; Williams, David M. [Full Text]; Wilson, D. [Abstract] [Full Text]; Wittenberg, Keith H. [Abstract] [Full Text]
X
Y: Yamaguchi, Koji [Abstract] [Full Text]; Yeon, Kyung Mo [Abstract] [Full Text]; Yoshimitsu, Kengo [Abstract] [Full Text]