American Journal of Roentgenology Online -- Index by Author (1 November 2000, 175, Number 5)

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Index by Author: 1 November 2000; 175 (5) [Table of Contents]

| A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z |

A: Abboud, Georges A. [Full Text]; Adatia, Ian [Abstract] [Full Text]; Akyar, Serdar [Abstract] [Full Text]; Alberico, Ronald A. [Abstract] [Full Text]; Arellano, Ron [Abstract] [Full Text]; Aslan, Ozgur [Full Text]; Atasoy, Çetin [Abstract] [Full Text]
B: Bagga, Harp [Full Text]; Baker, Mark E. [Abstract] [Full Text]; Baldisserotto, Matteo [Abstract] [Full Text]; Baur, A. [Abstract] [Full Text]; Berkovich, Gene Y. [Abstract] [Full Text]; Berlin, Leonard [Full Text]; Billing, A. [Abstract] [Full Text]; Bis, Kostaki G. [Full Text]; Blanc, Raphaël [Full Text]; Blankensteijn, J. D. [Abstract] [Full Text]; Bluemke, David A. [Abstract] [Full Text]; Body, Gilles [Abstract] [Full Text]; Boiselle, Phillip M. [Full Text]; Boland, Giles W. L. [Abstract] [Full Text]; Brennan, Frank J. [Full Text]; Broeders, I. A. M. J. [Abstract] [Full Text]; Brunereau, Laurent [Abstract] [Full Text]; Bui-Mansfield, Liem T. [Abstract] [Full Text]; Busheé, Gerald R. [Abstract] [Full Text]
C: Caoili, Elaine M. [Abstract] [Full Text]; Cesarani, Federico [Full Text]; Chasen, Marvin H. [Full Text]; Chen, Cheng-Yu [Abstract] [Full Text]; Cherukuri, Ravi [Abstract] [Full Text]; Chew, Felix S. [Abstract] [Full Text]; Chin, Shy-Chi [Abstract] [Full Text]; Cho, Do Jun [Abstract] [Full Text]; Cho, Kyoung Sik [Abstract] [Full Text]; Chung, Hsiao-Wen [Abstract] [Full Text]; Chung, Jae-Joon [Full Text]; Ciancibello, Leslie M. [Full Text]; Cloft, Harry J. [Full Text]; Cohan, Richard H. [Abstract] [Full Text]; Comstock, Christopher E. [Full Text]; Corsico, Marina [Full Text]; Cottier, Jean-Philippe [Abstract] [Full Text]; Crowe, John K. [Full Text]
D: Daffner, Richard H. [Abstract] [Full Text]; Darling, Marla L. Rosenfield [Abstract] [Full Text]; Davidson, Jon C. [Abstract] [Full Text]; De Waele, Sophie [Full Text]; De Zan, Antonio [Full Text]; DeMarco, J. Kevin [Abstract] [Full Text]; Denison, Christine M. [Abstract] [Full Text]; Derchi, Lorenzo E. [Abstract] [Full Text]; Dindar, Hüseyin [Abstract] [Full Text]; Dion, Jacques E. [Full Text]; DiPiro, Pamela J. [Abstract] [Full Text]; Doinoff, Cindy J. [Abstract] [Full Text]; Donnelly, Lane F. [Full Text]; Dunnick, N. Reed [Abstract] [Full Text]; Dupuy, Damian E. [Full Text]
E: Eikelboom, B. C. [Abstract] [Full Text]; Einstein, David M. [Abstract] [Full Text]; El-Hajj, Lisette F. [Full Text]; Eng, John [Abstract] [Full Text]; Ernst, Armin [Full Text]
F: Fauchier, Florence [Abstract] [Full Text]; Fessell, David P. [Full Text]; Filipek, Maureen S. [Full Text]; Fitoz, Suat [Abstract] [Full Text]; Floyd, Carey E. Jr. [Abstract] [Full Text]; Francis, Isaac R. [Abstract] [Full Text]; Freedom, Robert M. [Abstract] [Full Text]; Fujikawa, Akira [Full Text]; Furth, Emma E. [Abstract] [Full Text]
G: Gabriel, Helena [Full Text]; Gallas, Sophie [Abstract] [Full Text]; Gebara, Victor A. [Full Text]; Gefter, Warren B. [Abstract] [Full Text]; Gentili, Amilcare [Full Text]; Gervais, Debra A. [Abstract] [Full Text]; Gilkeson, R. C. [Full Text]; Giovagnorio, Francesco [Abstract] [Full Text]; Gitlin, Joseph N. [Abstract] [Full Text]; Gold, Richard H. [Full Text]; Goldberg, David J. [Abstract] [Full Text]; Goldberg, Marvin E. [Full Text]; Goldberg, S. Nahum [Full Text]; Greco, William [Abstract] [Full Text]; Gyepes, M. T. [Full Text]
H: Ha, Hyun Kwon [Abstract] [Full Text]; Haaga, John R. [Full Text]; Haber, Marian [Full Text]; Hahn, Dietbert [Abstract] [Full Text]; Hahn, Peter F. [Abstract] [Full Text]; Hall, Ferris M. [Full Text]; Hall, Lee D. [Full Text]; Hayes, Curtis W. [Full Text]; Heiss, M. [Abstract] [Full Text]; Heitmann, Kjell [Abstract] [Full Text]; Helmberger, T. [Abstract] [Full Text]; Herbreteau, Denis [Abstract] [Full Text]; Herts, Brian R. [Abstract] [Full Text]; Heuck, A. [Abstract] [Full Text]; Heussel, Claus Peter [Abstract] [Full Text]; Hiraki, Yoshio [Full Text]; Hong, Raymond [Full Text]; Hoppe, Florian [Abstract] [Full Text]; Hronas, Theo N. [Full Text]; Huber, A. [Abstract] [Full Text]
I: Ilhan, Huseyin [Full Text]; Inagaki, Masaru [Full Text]; Itai, Yuji [Abstract] [Full Text]
J: Jacobson, Jon A. [Full Text]; Jamar, François [Full Text]; Jeong, Hoon Yong [Abstract] [Full Text]; Joseph, Gregory J. [Full Text]; Julian, B. A. [Abstract] [Full Text]
K: Kaelin, Carolyn [Abstract] [Full Text]; Kanazawa, Susumu [Full Text]; Karp, Daniel D. [Full Text]; Kauczor, Hans-Ulrich [Abstract] [Full Text]; Kaya, Tamer [Full Text]; Kebapci, Mahmut [Full Text]; Keberle, Marc [Abstract] [Full Text]; Kelen, Gabor D. [Abstract] [Full Text]; Kemp, Bonnie L. [Full Text]; Kenney, P. J. [Abstract] [Full Text]; Kerwin, Glenn [Full Text]; Kew, C. E. II [Abstract] [Full Text]; Kim, Ah Young [Abstract] [Full Text]; Kim, Myeong-Jin [Full Text]; Kim, Pyo Nyun [Abstract] [Full Text]; Kim, Tae Hoon [Abstract] [Full Text]; Kim, Woong-Han [Abstract] [Full Text]; Kim, Yang Min [Abstract] [Full Text]; Kline, Mitch [Abstract] [Full Text]; Klufas, Roman [Abstract] [Full Text]; Kolonick, Renee M. [Abstract] [Full Text]; Korobkin, Melvyn [Abstract] [Full Text]; Koslin, D. Bradley [Full Text]; Kothimbakam, Rajmannar [Full Text]; Kumar, Nitin [Abstract] [Full Text]; Kurosaki, Yoshihisa [Full Text]
L: Lambert, Michel [Full Text]; Langer, Jill E. [Abstract] [Full Text]; Lassman, Charles [Abstract] [Full Text]; Laufer, Igor [Abstract] [Full Text]; Learch, Thomas J. [Full Text]; Lebrun, Jean-Luc [Abstract] [Full Text]; Lecouvet, Frédéric E. [Full Text]; Lee, Chueng-Chen [Abstract] [Full Text]; Lee, Jin Seong [Abstract] [Full Text]; Lee, Jong Tae [Full Text]; Lee, Kwo-Wei [Abstract] [Full Text]; Lee, Moon-Gyu [Abstract] [Full Text]; Lee, Young-Tak [Abstract] [Full Text]; Lenchik, Leon [Abstract] [Full Text]; Lester, Susan C. [Abstract] [Full Text]; Levine, Marc S. [Abstract] [Full Text]; Levine, Marc S. [Abstract] [Full Text]; Lewis, Curtis [Full Text]; Lieber, Michael [Abstract] [Full Text]; Lin, John [Full Text]; Listerud, John [Abstract] [Full Text]; Lo, Joseph Y. [Abstract] [Full Text]; Lopez-Ben, R. [Abstract] [Full Text]; Loud, Peter [Abstract] [Full Text]; Lu, David S. K. [Abstract] [Full Text]; Lynch, David A. [Abstract] [Full Text]
M: MacDonald, Cathy [Abstract] [Full Text]; Magid, Donna [Abstract] [Full Text]; Maki, Daniel D. [Abstract] [Full Text]; Maldjian, Joseph A. [Abstract] [Full Text]; Malghem, Jacques [Full Text]; Mali, W. P. Th. M. [Abstract] [Full Text]; Marchiori, Edson [Abstract] [Full Text]; Martin, Didier [Full Text]; Martinoli, Carlo [Abstract] [Full Text]; Marwede, Dirk [Abstract] [Full Text]; Meyer, Jack E. [Abstract] [Full Text]; Mikhailian, Haverj [Abstract] [Full Text]; Miller, Wallace T. Jr. [Abstract] [Full Text]; Miller, Wallace T. Jr. [Abstract] [Full Text]; Mimura, Hidefumi [Full Text]; Min, Young II [Abstract] [Full Text]; Mohsen, Nancy A. [Full Text]; Moret, Jacques [Full Text]; Mueller, Peter R. [Abstract] [Full Text]; Mueller, Peter R. [Abstract] [Full Text]; Munden, Reginald F. [Full Text]; Murphy, Brian [Abstract] [Full Text]; Mysko, William K. [Abstract] [Full Text]
N: Nesbitt, Jonathan C. [Full Text]; Nguyen, Binh [Abstract] [Full Text]; Niklason, Loren [Abstract] [Full Text]; Nishida, Masato [Abstract] [Full Text]; Nunes, Linda White [Full Text]
O: O'Neill, Mary J. [Abstract] [Full Text]; Oliver, Brian [Full Text]
P: Parikh, Tejas [Abstract] [Full Text]; Park, In Seung [Abstract] [Full Text]; Patel, Mahesh [Abstract] [Full Text]; Patel, Nilesh H. [Full Text]; Petsch, R. [Abstract] [Full Text]; Phillips, Stephen W. [Full Text]; Piotin, Michel [Full Text]; Pollina, Jonathan [Abstract] [Full Text]; Pretolesi, Fabio [Abstract] [Full Text]; Primack, Steven L. [Full Text]
Q
R: Raman, Steven S. [Abstract] [Full Text]; Reiser, M. [Abstract] [Full Text]; Remer, Erick M. [Abstract] [Full Text]; Renard, Regis [Abstract] [Full Text]; Rhei, Esther [Abstract] [Full Text]; Robba, Tiziana [Full Text]; Robbin, M. L. [Abstract] [Full Text]; Rodts, Gerald R. [Full Text]; Rogers, Lee F. [Full Text]; Rogers, Lee F. [Abstract] [Full Text]; Rose, David I. [Abstract] [Full Text]; Ross, Ian B. [Full Text]; Rouleau, Philippe [Abstract] [Full Text]; Rubesin, Stephen E. [Abstract] [Full Text]
S: Sadamori, Hiroshi [Full Text]; Sayre, James [Abstract] [Full Text]; Schepps, Barbara [Abstract] [Full Text]; Scott, William W. Jr. [Abstract] [Full Text]; Selland, Donna-Lee G. [Abstract] [Full Text]; Seo, Bo Kyoung [Abstract] [Full Text]; Silverstein, Mark [Full Text]; Simon, Carol [Abstract] [Full Text]; Slaba, Samy G. [Full Text]; Smith, Darrell N. [Abstract] [Full Text]; Smith, J. K. [Abstract] [Full Text]; Sugimura, Kazuro [Abstract] [Full Text]; Suh, Chang Hae [Abstract] [Full Text]; Sunshine, Jonathan H. [Abstract] [Full Text]
T: Tanaka, Noriaki [Full Text]; Tanaka, Yumiko Oishi [Abstract] [Full Text]; Thelen, Manfred [Abstract] [Full Text]; Tong, Frank C. [Full Text]; Tourassi, Georgia D. [Abstract] [Full Text]; Tranquart, François [Abstract] [Full Text]; Trusen, Andreas [Abstract] [Full Text]; Tuder, Rubin [Abstract] [Full Text]
U: Urrutia, Victor C. [Full Text]; Uthmann, Thomas [Abstract] [Full Text]
V: van Rijn, J. C. [Abstract] [Full Text]; Velling, Thomas E. [Full Text]; Venta, Luz A. [Full Text]; Vodopich, Darko J. [Abstract] [Full Text]
W: Wachsberg, Ronald H. [Abstract] [Full Text]; Waggershauser, T. [Abstract] [Full Text]; Watabe, John T. [Full Text]; Weadock, William J. [Full Text]; Weller, Gregory E. R. [Abstract] [Full Text]; Wever, J. J. [Abstract] [Full Text]; Whitman, Gary J. [Full Text]; Wittenberg, Guenther [Abstract] [Full Text]
X
Y: Yagi, Takahito [Full Text]; Yagmurlu, Aydin [Abstract] [Full Text]; Yamaguchi, Masayuki [Abstract] [Full Text]; Yang, Suck Kyun [Abstract] [Full Text]; Yoo, Hyung Sik [Full Text]; Yoo, Shi-Joon [Abstract] [Full Text]; Yoshimura, Koichi [Full Text]; Yoshizako, Takeshi [Abstract] [Full Text]; You, Eun-Sil [Abstract] [Full Text]
Z: Zimmerman, Robert A. [Abstract] [Full Text]