AJR -- Index by Author (May 2008; Volume 190, Number 5)

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Index by Author: 1 May 2008; 190 (5) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abbara, Suhny [Abstract] [Full Text]; Abraham, Linn [Abstract] [Full Text]; Ahn, Kook Jin [Abstract] [Full Text]; Ahuja, Anil T. [Abstract] [Full Text]; Alba, Esther [Abstract] [Full Text]; Angelico, Mario [Abstract] [Full Text]; Anooshiravani, Mehrak [Abstract] [Full Text]; Antonio, Gregory E. [Abstract] [Full Text]; Arizono, Shigeki [Abstract] [Full Text]; Arnous, Samer [Abstract] [Full Text]; Aubry, Marie-Cecile [Abstract] [Full Text]; Awai, Kazuo [Abstract] [Full Text]
B: B. Parente, Daniella [Abstract] [Full Text]; Baer, Jeanne W. [Abstract] [Full Text]; Baptista, Ana Célia [Abstract] [Full Text]; Beck-Razi, Nira [Abstract] [Full Text]; Beddy, Peter [Full Text]; Benachi, Alexandra [Abstract] [Full Text]; Bendix, Nadine [Abstract] [Full Text]; Bergamini, Alberto [Abstract] [Full Text]; Bergin, Diane [Abstract] [Full Text]; Bertini, Luca [Abstract] [Full Text]; Bi, Dongsong [Abstract] [Full Text]; Biermann, Janet S. [Abstract] [Full Text]; Bley, Thorsten A. [Abstract] [Full Text]; Bodner, Gerd [Abstract] [Full Text]; Bolacchi, Francesca [Abstract] [Full Text]; Boland, Giles W. L. [Full Text]; Bolliger, Stephan [Abstract] [Full Text]; Bolliger, Stephan [Abstract] [Full Text]; Bongartz, Georg [Abstract] [Full Text]; Bowles, Erin J. Aiello [Abstract] [Full Text]; Burbank, Fred [Abstract] [Full Text]; Buth, Jaap [Abstract] [Full Text]
C: Cadioli, Marcello [Abstract] [Full Text]; Carmenini, Enrico [Abstract] [Full Text]; Carney, Patricia A. [Abstract] [Full Text]; Carvalho, Antônio Carlos Pires [Abstract] [Full Text]; Casciani, Emanuele [Abstract] [Full Text]; Chami, Linda [Full Text]; Chan, Kai Ming [Abstract] [Full Text]; Chang, Silvia D. [Abstract] [Full Text]; Chaudhry, Fakhra S. [Abstract] [Full Text]; Cheatham, John P. [Abstract] [Full Text]; Choi, Dongil [Abstract] [Full Text]; Christe, Andreas [Abstract] [Full Text]; Cohen, Jodi [Abstract] [Full Text]; Colen, Rivka R. [Abstract] [Full Text]; Colletti, Patrick M. [Full Text]; Costello, Philip [Abstract] [Full Text]; Cozzolino, Valeria [Abstract] [Full Text]; Cruz, Luiz Celso Hygino da, Jr. [Abstract] [Full Text]; Cury, Ricardo C. [Abstract] [Full Text]
D: Dai, Yong [Abstract] [Full Text]; de Haan, Michiel W. [Abstract] [Full Text]; de Vries, A. H. [Abstract] [Full Text]; de Vries, Marianne [Abstract] [Full Text]; Dekker, E. [Abstract] [Full Text]; DeMaeseneer, Michel O. [Abstract] [Full Text]; Dillman, Jonathan R. [Abstract] [Full Text]; Dodd, Jonathan D. [Abstract] [Full Text]; Domingues, Roberto Cortes [Abstract] [Full Text]; Domingues, Romeu Cortes [Abstract] [Full Text]; Dominguez, Juan [Abstract] [Full Text]; Dumez, Yves [Abstract] [Full Text]; Dunfee, Brian L. [Abstract] [Full Text]; Dzyubak, Oleksandr P. [Abstract] [Full Text]
E: Ebrahim, Farhad S. [Abstract] [Full Text]; Eftekhari, Farzin [Full Text]; Eichhorn, Joachim G. [Abstract] [Full Text]; Elmore, Joann G. [Abstract] [Full Text]; Elsayes, Khaled M. [Abstract] [Full Text]; Engel, Ahuva [Abstract] [Full Text]; Escalante, Elena [Abstract] [Full Text]; Espinosa, Leandro A. [Abstract] [Full Text]
F: Fintelmann, Florian [Abstract] [Full Text]; Fischer, Doron [Abstract] [Full Text]; Fletcher, Joel G. [Abstract] [Full Text]; Floriani, Irene [Abstract] [Full Text]; Florie, J. [Abstract] [Full Text]; for the Program for the Assessment of Radiological Technology, [Abstract] [Full Text]; Frager, David H. [Abstract] [Full Text]
G: Gaitini, Diana [Abstract] [Full Text]; Galiano, Klaus [Abstract] [Full Text]; Gallagher, Thomas A. [Abstract] [Full Text]; Gasparetto, Emerson L. [Abstract] [Full Text]; Giovanoli, Olivier [Abstract] [Full Text]; Glodny, Bernhard [Abstract] [Full Text]; Gonsalves, Carin F. [Abstract] [Full Text]; Grabherr, Silke [Abstract] [Full Text]; Grabherr, Silke [Abstract] [Full Text]; Griffith, James F. [Abstract] [Full Text]; Gruber, Hannes [Abstract] [Full Text]; Gualdi, Gian Franco [Abstract] [Full Text]; Gunderman, Richard B. [Abstract] [Full Text]; Günther, Rolf W. [Abstract] [Full Text]; Gygax, Erich [Abstract] [Full Text]
H: Hacein-Bey, Lotfi [Abstract] [Full Text]; Hahn, Seong Tai [Abstract] [Full Text]; Hanquinet, Sylviane [Abstract] [Full Text]; Hartman, Robert P. [Abstract] [Full Text]; Heiken, Jay P. [Abstract] [Full Text]; Heim, Markus [Abstract] [Full Text]; Herzog, Christopher [Abstract] [Full Text]; Hill, Sharon L. [Abstract] [Full Text]; Hirokawa, Yuusuke [Abstract] [Full Text]; Hunink, M. G. Myriam [Abstract] [Full Text]
I: Imamovíc, Goran [Abstract] [Full Text]; Isoda, Hiroyoshi [Abstract] [Full Text]; Itzhak, Ofer Ben [Abstract] [Full Text]
J: Jacobson, Jon A. [Abstract] [Full Text]; Jamadar, David A. [Abstract] [Full Text]; Jourdan, Claudia [Abstract] [Full Text]
K: Kalantari, Babak N. [Abstract] [Full Text]; Kang, Hoyeong [Abstract] [Full Text]; Kaori, Togashi [Abstract] [Full Text]; Kawashima, Akira [Abstract] [Full Text]; Kim, Bum Soo [Abstract] [Full Text]; Kim, Chan Kyo [Abstract] [Full Text]; Kim, Eun-Kyung [Abstract] [Full Text]; Kim, EunJu [Abstract] [Full Text]; Kim, Min Jung [Abstract] [Full Text]; Kim, Sam Soo [Abstract] [Full Text]; Kim, Sung-Moon [Abstract] [Full Text]; Kim, Young-sun [Abstract] [Full Text]; Kitslaar, Peter J. E. H. M. [Abstract] [Full Text]; Knobloch, Karsten [Full Text]; Ko, Kyung Hee [Abstract] [Full Text]; Kolodny, Gerald M. [Abstract] [Full Text]; Koo, Chi Wan [Abstract] [Full Text]; Koontz, Nicholas A. [Abstract] [Full Text]; Kopf, Helmut [Abstract] [Full Text]; Krausz, Michael M. [Abstract] [Full Text]; Kretschmer, Matthew T. [Abstract] [Full Text]; Kubosch, David [Abstract] [Full Text]; Kwak, Jin Young [Abstract] [Full Text]
L: La Scala, Giorgio [Abstract] [Full Text]; Larson, David B. [Full Text]; Ledermann, Hans P. [Abstract] [Full Text]; Lee, Hyun Moo [Abstract] [Full Text]; Lee, Mi Hee [Abstract] [Full Text]; Lee, Sang-Ho [Abstract] [Full Text]; Lee, Won Jae [Abstract] [Full Text]; Lev-Toaff, Anna S. [Abstract] [Full Text]; Levine, Marc S. [Abstract] [Full Text]; Li, Chuanfu [Abstract] [Full Text]; Lim, Hyo K. [Abstract] [Full Text]; Liu, Duo [Abstract] [Full Text]; Liu, Wei Chiang [Abstract] [Full Text]; Lladó, Laura [Abstract] [Full Text]; Long, Frederick R. [Abstract] [Full Text]; Lucey, Brian C. [Abstract] [Full Text]
M: Maetani, Yoji S. [Abstract] [Full Text]; Mahnken, Andreas H. [Abstract] [Full Text]; Mandrekar, Jayawant N. [Abstract] [Full Text]; Marom, Edith M. [Full Text]; Martinez, Laura [Abstract] [Full Text]; Masselli, Gabriele [Abstract] [Full Text]; Mayo-Smith, William W. [Abstract] [Full Text]; McCollough, Cynthia H. [Abstract] [Full Text]; Menias, Christine O. [Abstract] [Full Text]; Merlini, Laura [Abstract] [Full Text]; Miglioretti, Diana L. [Abstract] [Full Text]; Milz, Stefan [Abstract] [Full Text]; Mitchell, Donald G. [Abstract] [Full Text]; Mor-Yosef, David [Abstract] [Full Text]; Mühlenbruch, Georg [Abstract] [Full Text]; Mulvihill, Denise M. [Abstract] [Full Text]
N: Nakaura, Takeshi [Abstract] [Full Text]; Nemeth, Alexander J. [Abstract] [Full Text]; Nguyen, Shaun A. [Abstract] [Full Text]; Nio, C. Y. [Abstract] [Full Text]; Nomori, Hiroaki [Abstract] [Full Text]; Nomura, Akinori [Abstract] [Full Text]; Nouh, Mohamed R. [Abstract] [Full Text]
O: O'Neill, Ailbhe [Full Text]; Oda, Seitaro [Abstract] [Full Text]; Oesterhelweg, Lars [Abstract] [Full Text]; Oesterhelweg, Lars [Abstract] [Full Text]; Oh, Ki Keun [Abstract] [Full Text]; Omerovíc, Safet [Abstract] [Full Text]; Orlacchio, Antonio [Abstract] [Full Text]; Ouwendijk, Rody [Abstract] [Full Text]
P: Paeng, Sung Suk [Abstract] [Full Text]; Park, Byoung-Woo [Abstract] [Full Text]; Park, Byung Kwan [Abstract] [Full Text]; Park, Young Hak [Abstract] [Full Text]; Parker, Laurence [Abstract] [Full Text]; Parsons, Edward C., Jr. [Full Text]; Pattynama, Peter M. T. [Abstract] [Full Text]; Peer, Siegfried [Abstract] [Full Text]; Peiry, Barbara [Abstract] [Full Text]; Platt, Joel F. [Abstract] [Full Text]; Plumhans, Cédric [Abstract] [Full Text]; Polettini, Elisabetta [Abstract] [Full Text]; Primak, Andrew N. [Abstract] [Full Text]; Prince, Martin R. [Abstract] [Full Text]
Q: Quinn, Martin [Abstract] [Full Text]
R: Raman, Subha V. [Abstract] [Full Text]; Rapaee, Annuar [Abstract] [Full Text]; Regenscheit, Priska [Abstract] [Full Text]; Rhim, Hyunchul [Abstract] [Full Text]; Ross, Steffen [Abstract] [Full Text]; Ross, Steffen [Abstract] [Full Text]; Ruano, Rodrigo [Abstract] [Full Text]; Rubesin, Stephen E. [Abstract] [Full Text]; Ryan, Ronan [Abstract] [Full Text]; Rybak, Leon [Abstract] [Full Text]
S: Sabb, Brian J. [Abstract] [Full Text]; Saket, Daniel D. [Full Text]; Salamon, Noriko [Abstract] [Full Text]; Savino, Giancarlo [Abstract] [Full Text]; Schmidt, Bernhard [Abstract] [Full Text]; Schoepf, U. Joseph [Abstract] [Full Text]; SchutzeKool, Leo J. [Abstract] [Full Text]; Schweitzer, Mark E. [Abstract] [Full Text]; Serrano, Teresa [Abstract] [Full Text]; Seyfarth, Tobias [Abstract] [Full Text]; Shah-Patel, Lisa R. [Abstract] [Full Text]; Shibata, Toshiya [Abstract] [Full Text]; Sickles, Edward A. [Abstract] [Full Text]; Sim, Kui-Hian [Abstract] [Full Text]; Simonetti, Giovanni [Abstract] [Full Text]; Song, Julie H. [Abstract] [Full Text]; Soto, Jorge A. [Abstract] [Full Text]; Spendlove, Danny [Abstract] [Full Text]; Spies, Marcus [Full Text]; Sprecher, Christoph M. [Abstract] [Full Text]; Stijnen, Theo [Abstract] [Full Text]; Stoker, J. [Abstract] [Full Text]; Strasak, Alexander [Abstract] [Full Text]; Strohm, Peter C. [Abstract] [Full Text]; Südkamp, Norbert P. [Abstract] [Full Text]
T: Takahashi, Naoki [Abstract] [Full Text]; Terracciano, Luigi [Abstract] [Full Text]; Thali, Michael J. [Abstract] [Full Text]; Thali, Michael J. [Abstract] [Full Text]; Thoeni, Ruedi F. [Abstract] [Full Text]; Tielbeek, Alexander V. [Abstract] [Full Text]
V: Valls, Carlos [Abstract] [Full Text]; van der Vliet, Daan A. [Abstract] [Full Text]; van Engelshoven, Jos M. A. [Abstract] [Full Text]; van Sambeek, Marc R. H. M. [Abstract] [Full Text]; van Vliet, L. J. [Abstract] [Full Text]; van Wijk, C. [Abstract] [Full Text]; Venema, H. W. [Abstract] [Full Text]; Verma, Sachit K. [Abstract] [Full Text]; Vogl, Thomas J. [Abstract] [Full Text]; Vogt, Peter M. [Full Text]; Vos, F. M. [Abstract] [Full Text]; Vrtiska, Terri J. [Abstract] [Full Text]
W: Weiss, Martin M. [Full Text]; Weiss, Matthew A. [Full Text]; Werner, Bernhard [Abstract] [Full Text]; Willatt, Jonathon M. [Abstract] [Full Text]; Williams, Gethin [Abstract] [Full Text]; Wong, Anthony D. [Full Text]; Wong, Eric M. C. [Abstract] [Full Text]
Y: Yamashita, Yasuyuki [Abstract] [Full Text]; Yanaga, Yumi [Abstract] [Full Text]; Yankaskas, Bonnie C. [Abstract] [Full Text]; You, Jai Kyung [Abstract] [Full Text]; Yu, Alfred B. [Abstract] [Full Text]; Yu, Dexin [Abstract] [Full Text]; Yung, Patrick S. H. [Abstract] [Full Text]
Z: Zerem, Enver [Abstract] [Full Text]; Zhang, Hong Lei [Abstract] [Full Text]; Zhang, Xiao Ming [Abstract] [Full Text]; Zugaib, Marcelo [Abstract] [Full Text]